Synthesis and Characterization of C, SnO2, and C+SnO2 Materials through Resistance Measurement, UV-Visible Spectroscopy, and X-Ray Diffraction

Abstract

The objectives of this study are i) to determine an electrical property, especially resistance, of carbon  (C), tin oxide (SnO₂), and C+SnO2 thin films. ii) to determine the optical property of C, SnO₂ and C+SnO₂ thin films based on UV-visible spectroscopy (UV-Vis). and iii) to determine the crystallinity of C, SnO₂ and C+SnO₂ thin films based on X-ray diffraction (XRD). The results show different physical characteristics from the three samples of the thin film layers. The result on the resistance measurement shows that C thin film has the lowest resistance, followed by SnO2, and C+SnO2 thin films with resistance values of 1.0769 mΩ, 1.0774 mΩ, and 3.8875 mΩ, respectively. The UV-Vis results show a peak for each of the thin film at 256 nm, 257 nm, and 258 nm for C, SnO₂, and C+SnO₂, respectively, which is in the UV area. The XRD results show that the C and SnO₂ thin layers are amorphous while C+SnO₂ thin layer is crystal