Synthesis and Characterization of C, SnO2, and C+SnO2 Materials through Resistance Measurement, UV-Visible Spectroscopy, and X-Ray Diffraction

  • Nabila Rahmasari Universitas Negeri Yogyakarta
  • Azka Fathia
  • Wipsar Dwandaru

Abstract

The objectives of this study are i) to determine an electrical property, especially resistance, of carbon  (C), tin oxide (SnO2), and C+SnO2 thin films. ii) to determine the optical property of C, SnO2 and C+SnO2 thin films based on UV-visible spectroscopy (UV-Vis). and iii) to determine the crystallinity of C, SnO2 and C+SnO2 thin films based on X-ray diffraction (XRD). The results show different physical characteristics from the three samples of the thin film layers. The result on the resistance measurement shows that C thin film has the lowest resistance, followed by SnO2, and C+SnO2 thin films with resistance values of 1.0769 mΩ, 1.0774 mΩ, and 3.8875 mΩ, respectively. The UV-Vis results show a peak for each of the thin film at 256 nm, 257 nm, and 258 nm for C, SnO2, and C+SnO2, respectively, which is in the UV area. The XRD results show that the C and SnO2 thin layers are amorphous while C+SnO2 thin layer is crystal

Published
2018-02-13
How to Cite
RAHMASARI, Nabila; FATHIA, Azka; DWANDARU, Wipsar. Synthesis and Characterization of C, SnO2, and C+SnO2 Materials through Resistance Measurement, UV-Visible Spectroscopy, and X-Ray Diffraction. Jurnal Teras Fisika, [S.l.], v. 1, n. 1, p. 29-33, feb. 2018. ISSN 2615-1219. Available at: <http://jos.unsoed.ac.id/index.php/tf/article/view/565>. Date accessed: 21 july 2018. doi: https://doi.org/10.20884/1.jtf.2018.1.1.565.
Section
Articles