TY - JOUR AU - Rahmasari, Nabila AU - Fathia, Azka AU - Dwandaru, Wipsar PY - 2018/02/13 TI - Synthesis and Characterization of C, SnO2, and C+SnO2 Materials through Resistance Measurement, UV-Visible Spectroscopy, and X-Ray Diffraction JF - Jurnal Teras Fisika: Teori, Modeling, dan Aplikasi Fisika; Vol 1 No 1 (2018): Jurnal Teras Fisika: Teori, Modeling, dan Aplikasi FisikaDO - 10.20884/1.jtf.2018.1.1.565 KW - N2 - The objectives of this study are i) to determine an electrical property, especially resistance, of carbon  (C), tin oxide (SnO 2 ), and C+SnO2 thin films. ii) to determine the optical property of C, SnO 2 and C+SnO 2 thin films based on UV-visible spectroscopy (UV-Vis). and iii) to determine the crystallinity of C, SnO 2 and C+SnO 2 thin films based on X-ray diffraction (XRD). The results show different physical characteristics from the three samples of the thin film layers. The result on the resistance measurement shows that C thin film has the lowest resistance, followed by SnO2, and C+SnO2 thin films with resistance values of 1.0769 mΩ, 1.0774 mΩ, and 3.8875 mΩ, respectively. The UV-Vis results show a peak for each of the thin film at 256 nm, 257 nm, and 258 nm for C, SnO 2 , and C+SnO 2 , respectively, which is in the UV area. The XRD results show that the C and SnO 2 thin layers are amorphous while C+SnO 2 thin layer is crystal UR - http://jos.unsoed.ac.id/index.php/tf/article/view/565